The Auto SE is a state-of-the-art thin film measurement tool designed for fully automated analysis with simple push-button operation. It delivers rapid sample analysis within seconds, providing detailed reports on thin film stack characteristics, including thickness, optical constants, surface roughness, and inhomogeneities.

Key features include an automatic XYZ stage, real-time imaging of measurement sites, automatic spot size selection, and a variety of accessories for diverse applications. The system also incorporates built-in diagnostic indicators for problem detection, troubleshooting guidance, and operator support.

With its ease of use and advanced automation, the Auto SE is a turnkey solution ideal for routine thin film measurements and quality control.